Power Source Arrangement and Method of Diagnosing a Power Source Arrangement

ABSTRACT

An embodiment method of diagnosing a power source arrangement includes a plurality of n power sources connected in series between output terminals, wherein n≧2. At least two different groups of power sources are selected from the power source arrangement. A voltage of each of the at least two different groups is measured between the output terminals. During the measurement of the voltage of one group, the power sources of the power source arrangement that do not belong to the one group are bypassed. The at least two measured voltages obtained through measuring the voltage of each of the at least two different groups or at least two voltages that are dependent on these at least two measured voltages are compared.

TECHNICAL FIELD

Embodiments of the present invention relate to a power sourcearrangement, in particular a power source arrangement including severalpower sources, such as photovoltaic (PV) modules, connected in series.

BACKGROUND

With an increasing interest in sustainable energy production there is afocus on using photovoltaic modules for producing electric power.Photovoltaic (PV) modules include a plurality of photovoltaic (PV)cells, that are also known as solar cells. Usually several solar modulesare connected in series to form a string of modules. A DC output voltageprovided by the string may then be converted into an AC voltage, suchas, for example, a voltage suitable to be supplied to a power grid or todrive a motor.

In an ideal case each of the modules connected in series provides thesame output voltage. In real photovoltaic arrangements there may bemodules that provide a lower voltage than other modules. This may be dueto wear, corrosion of contacts within the module, and the like.

In order to optimize the output of a solar arrangement with a pluralityof PV modules a Maximum Power Point (MPP) tracker may be coupled to eachof the modules. The MPP trackers monitor the output powers of theindividual modules and operate the individual modules in their MPP.Through the MPP trackers the output powers of the individual modules areknown so that a deviation of the output power of one module from theoutput power of other modules may easily be detected, so that suitablemeasures can be taken.

MPP trackers, however, are expensive so that in large solar power plantsa MPP tracker is at most coupled to one string with a plurality ofmodules but not to the individual modules.

Nevertheless, there is a need to monitor in a cost efficient way theoutput voltage of power sources, such as PV modules, in a string with aplurality of power sources connected in series.

SUMMARY OF THE INVENTION

A first aspect relates to a method of diagnosing a power sourcearrangement including a plurality of n power sources connected in seriesbetween output terminals, wherein n≧2. The method includes at least onevoltage comparison. The at least one voltage comparison includesselecting at least two different groups of power sources from the powersource arrangement, and measuring the voltage of each group between theoutput terminals, wherein during the measurement of the voltage of onegroup the power sources of the power source arrangement that do notbelong to the one group are bypassed. The method further includescomparing the at least two measured voltages obtained through measuringthe voltage of each of the at least two groups, or comparing voltagesdependent on these at least two measured voltages.

A second aspect relates to a circuit arrangement including a powersource arrangement having output terminals and a plurality of n powersources connected in series between the output terminals, wherein n≧2,and a diagnostic circuit coupled to the power source arrangement. Thediagnostic circuit is configured to select at least two different groupsof power sources from the power source arrangement, to measure thevoltage of each group between the output terminals, wherein during themeasurement of the voltage of one group the power sources of the powersource arrangement that do not belong to the one group are bypassed, andto compare the at least two measured voltages obtained through measuringthe voltage of each of the at least two groups, or to compare voltagesdependent on these at least two measured voltages.

BRIEF DESCRIPTION OF THE DRAWINGS

Examples will now be explained with reference to the drawings. Thedrawings serve to illustrate the basic principle, so that only aspectsnecessary for understanding the basic principle are illustrated. Thedrawings are not to scale. In the drawings the same reference charactersdenote like features.

FIG. 1 schematically illustrates a first embodiment of a circuitarrangement that includes a power source arrangement with a plurality ofpower sources and a diagnostic circuit;

FIG. 2 illustrates a first embodiment of the diagnostic circuit;

FIG. 3 illustrates a first embodiment of a power source implemented as aphotovoltaic (PV) module;

FIG. 4 illustrates one embodiment of a bypass circuit of the diagnosticcircuit;

FIG. 5 which includes FIGS. 5A and 5B, illustrates a first embodiment ofa method of diagnosing a power source arrangement; and

FIG. 6 which includes FIGS. 6A, 6B, 6C and 6D illustrates a furtherembodiment of a method of diagnosing a power source arrangement.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

In the following detailed description, reference is made to theaccompanying drawings, which form a part thereof, and in which is shownby way of illustration specific embodiments in which the invention maybe practiced. In this regard, directional terminology, such as “top”,“bottom”, “front”, “back”, “leading”, “trailing” etc., is used withreference to the orientation of the figures being described. Becausecomponents of embodiments can be positioned in a number of differentorientations, the directional terminology is used for purposes ofillustration and is in no way limiting. It is to be understood thatother embodiments may be utilized and structural or logical changes maybe made without departing from the scope of the present invention. Thefollowing detailed description, therefore, is not to be taken in alimiting sense, and the scope of the present invention is defined by theappended claims. It is to be understood that the features of the variousexemplary embodiments described herein may be combined with each other,unless specifically noted otherwise.

FIG. 1 illustrates a first embodiment of a circuit arrangement. Thecircuit arrangement includes a power source arrangement 1 with aplurality of n, wherein n≧2, power sources 10 ₁, 10 ₂, 10 ₃, 10 _(n)connected in series between output terminals 11, 12 of the power sourcearrangement 1. In operation of the power source arrangement 1 each ofthe power sources 10 ₁, 10 ₂, 10 ₃, 10 _(n) provides an output voltageV10 ₁, V10 ₂, V10 ₃, V10 _(n), so that an output voltage V1 of the powersource arrangement 1 between the output terminals 11, 12 corresponds tothe sum of the individual output voltages:

$\begin{matrix}{{V\; 1} = {\sum\limits_{i = 1}^{n}\; {V\; 10_{i}}}} & (1)\end{matrix}$

According to one embodiment, the individual power sources 10 ₁-10 _(n)are DC power sources, so that the output voltage V1 of the power sourcearrangement 1 is a DC output voltage. Optionally, an inverter 100 isconnected to the output terminals 11, 12 and is configured to generatean AC output voltage V_(AC) from the DC output voltage V1 provided bythe power source arrangement 1. Any type of DC power sources can beimplemented in the power source arrangement 1, such as photovoltaic (PV)modules or battery modules, such as lithium-ion battery modules.

The individual power sources 10 ₁-10 _(n) are configured such that in anormal operation of the power source arrangement 1 the individual powersources 10 ₁-10 _(n) provide approximately equal output voltages V10₁-V10 _(n). However, there may be scenarios in which the output voltageof one of the power sources 10 ₁-10 _(n) is lower than the outputvoltages of other power sources. In a photovoltaic arrangement with aplurality of power sources implemented as PV modules the output voltageof one PV module can be lower than the output power of other PV moduleswhen (for example, due to shading) the solar power received by the onePV module is lower than the solar power received by the other modules.While this is a natural scenario, there may be scenarios in which alower output voltage of one power source is the result of a defect inthe power source. It is therefore desired to detect whether the powersource arrangement 1 includes a power source 10 ₁-10 _(n) that providesan output voltage (supply voltage) lower than output voltages of theother power sources 10 ₁-10 _(n). Specifically, it is desired to detectwhich of the power sources 10 ₁-10 _(n) provides a lower output voltage.

Referring to FIG. 1, the circuit arrangement includes a diagnosticcircuit 2. The diagnostic circuit 2 has input terminals coupled to theoutput terminals 11, 12 of the power source arrangement 1 and isconfigured to measure the voltage between these output terminals. Thediagnostic circuit 2 is further configured to operate the power sourcearrangement 1 in a diagnostic mode and is configured in the diagnosticmode to at least detect whether there is a power source in the powersource arrangement 1 that provides an output voltage lower than theoutput voltages of other power sources 10 ₁-10 _(n) in the power sourcearrangement 1. In the diagnostic mode, the diagnostic circuit 2 isconfigured to select at least two different groups of power sources fromthe power source arrangement, to measure the voltage of each groupbetween the output terminals 11, 12, where during the measurement of thevoltage of one group the power sources of the power source arrangement 1that do not belong to the one group are bypassed, and to compare the atleast two voltages obtained through measuring the voltage of each of theat least two groups. In the diagnostic mode, the output voltage V1corresponds to the sum of the output voltages of the power sources ofone group, which are the power sources that are not bypassed. Detailsand further embodiments of the method will be explained herein furtherbelow.

An embodiment of the diagnostic circuit 2 is illustrated in greaterdetail in FIG. 2. The diagnostic circuit 2 of FIG. 2 includes a bypasscircuit 3 and a measurement and control circuit 4. The bypass circuit 3includes at least one bypass unit coupled to one power source, whereasin the embodiment illustrated in FIG. 2, each power source 10 ₁-10 _(n)has a bypass unit 30 ₁-30 _(n) coupled thereto, so that the number ofbypass units 30 ₁-30 _(n) of the bypass circuit 3 equals the number ofpower sources 10 ₁-10 _(n). A power source, such as, for example, afirst power source 10 ₁, and the corresponding bypass unit, such as, forexample, a first bypass unit 30 ₁, are connected in parallel.

Each bypass unit 30 ₁-30 _(n) is in signal communication with themeasurement and control circuit 4 and is configured to bypass theassociated power source dependent on a control signal S30 ₁, S30 ₂, S30₃, S30 _(n) received from the measurement and control circuit 4. Thesignal communication path between the measurement and control circuit 4and the individual bypass units 30 ₁-30 _(n) is only schematicallyillustrated in FIG. 2. Any type of signal communication path that issuitable to transmit the control signals S30 ₁-S30 _(n) to the bypasscircuit 3 may be employed. According to one embodiment there is atransmission channel between the measurement and control circuit 4 andeach of the bypass units 30 ₁-30 _(n) so that there is a dedicatedtransmission channel for each of the control signals S30 ₁-S30 _(n).According to another embodiment there is signal bus that couples themeasurement and control circuit 4 to the bypass units 30 ₁-30 _(n). Thecontrol signals S30 ₁-S30 _(n) are transmitted via the signal bus, wherethe bypass units 30 ₁-30 _(n) are configured to “listen to the bus” andto receive their corresponding control signal S30 ₁-S30 _(n) from thebus. Any type of signal bus and the corresponding transmission protocolmay be employed for the signal communication between the measurement andcontrol circuit 4 and the bypass units 30 ₁-30 _(n).

Assigning one bypass unit 30 ₁-30 _(n) to each power source 10 ₁-10 _(n)is only an example. The number of bypass units 30 ₁-30 _(n) could beless than the number of power sources 10 ₁-10 _(n), so that there arepower sources that have no bypass unit connected thereto, or so that onebypass unit is connected in parallel to a series circuit with at leasttwo power sources.

FIG. 3 illustrates a first embodiment of one power module 10. The powermodule 10 illustrated in FIG. 3 represents an arbitrary one of the powermodules 10 ₁-10 _(n) illustrated in FIGS. 1 and 2. According to oneembodiment, the individual power modules 10 ₁-10 _(n) of the powersource arrangement 1 have the same architecture, which means they areimplemented in the same way.

The power module 10 of FIG. 3 is implemented as a solar or photovoltaic(PV) module and includes a plurality of solar cells 15 connected inseries between output terminals 13, 14 of the power module 10. Betweenthe output terminals 13, 14 of the power module 10, the output voltageV10 of the power module 10 is available. The output terminals 13, 14serve to connect the individual power modules (10 ₁-10 _(n) in FIGS. 1and 2) in series between the output terminals 11, 12 of the power sourcearrangement 1. The number of solar cells 15 connected in series withinthe PV module 10 is dependent on the specific application. According toone embodiment, the number of solar cells 15 connected in series isbetween 48 and 72. According to one embodiment, the number of solarcells in the individual power sources or PV modules 10 ₁-10 _(n) isequal.

Referring to FIG. 3, the series circuit with the solar cells 15 isoptionally sub-divided into a plurality of m series circuits(sub-circuits) 16 ₁, 16 ₂, 16 _(m) of solar cells. A rectifier element17 ₁, 17 ₂, 17 _(m), such as a diode, is connected in parallel with eachof these sub-circuits 16 ₁, 16 ₂, 16 _(m). According to one embodiment,the module 10 includes m=3 sub-circuits and, therefore, m=3 rectifierelements 17 ₁, 17 ₂, 17 _(m). The number of solar cells 15 in theindividual sub-circuits 16 ₁, 16 ₂, 16 _(m) may be equal, such as, forexample, between 16 and 24, dependent on the overall number of solarcells 15 in the power module 10.

The rectifier elements 17 ₁-17 _(m) are bypass elements that areconfigured to bypass the corresponding sub-circuits 16 ₁-16 _(m). Arectifier element 17 _(i) bypasses the corresponding sub-circuit 16 _(i)(where 16 _(i) and 17 _(i) denote one of the sub-circuits and thecorresponding rectifier element) when, for example, the solar cells 15of the corresponding sub-circuit 16 _(i) receive a solar power that isless then the solar power received by the solar cells 15 of the othersub-circuits. This is explained in the following.

For explanation purposes it is at first assumed that the PV module 10 isconnected to other power sources implemented as PV modules and that thepower source arrangement (1 in FIG. 1) is connected to a load, so thatthere is an output current at the output terminals 13, 14 of the PVmodules. Further, it is assumed that the solar power received by theindividual solar cells of the PV module 10 is equal, so that theindividual solar cells 15 provide equal output currents that correspondto the output current at the output terminals 13, 14 of the PV module10. In this operation mode, each of the individual solar cells 15 actsas a current source. When, however, solar cells of one sub-circuit 16_(i) of the sub-circuits 16 ₁-16 _(m) receive a lower solar power thanthe solar cells of the other sub-circuits, these solar cells lose theircapability to provide the required output current. Absent the rectifierelement 17 _(i) voltages across these solar cells would change theirpolarity and these solar cells would behave like loads in which a partof the electrical power provided by other solar cells is consumed. Thiswould significantly reduce the efficiency of the PV module 10. Therectifier element 17 _(i) clamps the voltage across one sub-circuit 16_(i) to the forward voltage of the rectifier element 17 _(i) when thepolarity of the voltage across the sub-circuit 16 _(i) changes itspolarity when one or several solar cells 15 of the correspondingsub-circuit are in a load mode. The power losses that may occur in onesub-circuit 16 _(i) that has at least one solar cell operated in theload-mode are limited through the rectifier elements 17 ₁-17 _(m).

Of course, more than one sub-circuit in the PV module can be bypassed atonce. For example, each of the sub-circuits 16 ₁-16 _(m) of one PVmodule 10 can be bypassed by the corresponding rectifier element 17 ₁-17_(m) when, for example, the solar cells of one PV module 10 receive alower solar power than the solar cells of other PV modules connected inseries with the one PV module 10.

Instead of diodes, as illustrated in FIG. 3, other types of rectifierelements may be used as well for implementing the rectifier elements 17_(i), 17 ₂, 17 _(m). According to one embodiment (not shown), therectifier elements 17 _(i), 17 ₂, 17 _(m) are electronic switches, suchas transistors, that are connected to a drive circuit that switches arectifier element on each time the voltage across the correspondingsub-circuit changes the polarity. Implementing the rectifier elements 17₁, 17 ₂, 17 _(m) as electronic switches further allows to apply adiagnostic procedure as explained with reference to FIGS. 1 and 2 to oneindividual PV module in order to detect whether there is a sub-circuitin the PV module that provides a lower supply voltage than othersub-circuits in the PV module.

FIG. 4 schematically illustrates an embodiment of one bypass unit 30 andof a power source 10 coupled thereto. The bypass unit 30 in FIG. 4represents an arbitrary one of the bypass units 30 ₁-30 _(n) illustratedin FIG. 2. The control signal S30 illustrated in FIG. 5 represents thecontrol signal received by the bypass unit 30 from the measurement andcontrol circuit (not illustrated in FIG. 4).

Referring to FIG. 4, the bypass unit 30 includes an electronic switch31, such as a transistor, having a load path and a control terminal. Theload path of the electronic switch 31 is connected in parallel with thepower source 10. The bypass unit 30 further includes a control unit 32that receives the control signal S30 and that is configured to drive theelectronic switch 31 dependent on the control signal S30. The controlunit 32 generates a drive signal S31 received at the control terminal ofthe electronic switch 31. In the embodiment illustrated in FIG. 4, theelectronic switch 31 is a transistor, in particular an n-type MOSFET.However, implementing the electronic switch 31 as n-type MOSFET is onlyan example. The electronic switch 31 could also be implemented as anyother type of transistor, such as a p-type MOSFET or an IGBT, or as anyother type of electronic switch.

The control unit 32 includes power supply terminals 32 ₁, 32 ₂ coupledto the power source 10. Optionally, a charge storage element 33, such asa capacitor, is coupled between the supply terminals 32 ₁, 32 ₂ and iscoupled to the power source 10 via a rectifier element 34, such as adiode. The charge storage element 33 is charged by the power source 10via the rectifier element 34 when the power source 10 provides an outputvoltage V10 other than zero. When the output voltage V10 of the powersource 10 decreases, the charge storage element 33 provides for asufficient power supply of the control circuit 32 in order to switch theelectronic switch 31 to the desired switching state (on or off). Therectifier element 34 prevents the charge storage element 33 from beingdischarged when the supply voltage V10 of the power source 10 decreases.

In the embodiment illustrated in FIG. 4, the supply voltage provided tothe control unit 32 and the charge storage element 33, respectively, isabout the output voltage V10 of the power source 10. However, this isonly an example. According to a further embodiment (not illustrated) thesupply voltage provided to the control unit 32 is derived from theoutput voltage V10 but is lower than the output voltage V10.

The control unit 32 switches the electronic switch 31 on or offdependent on the control signal S30. The bypass unit 30 bypasses thepower source 10 when the electronic switch 31 is switched on. Thecontrol circuit 32 is configured to receive the control signal S30 andto generate the drive signal S31 dependent on the control signal S30.The control circuit 32 further includes a receiver or interface circuitthat is configured to be in signal communication with the measurementcontrol circuit 4. When, for example, there is a signal bus between themeasurement and control circuit 4 and the individual bypass units, suchas the bypass unit 30 illustrated in FIG. 5, the control circuit 32includes a bus interface circuit that is configured to listen to the busand to retrieve those control signals from the bus that are dedicated tothe individual bypass unit. Different types of signal busses and thecorresponding bus interfaces that are commonly known may be employed inthe circuit arrangement.

Referring to FIG. 2, the measurement and control circuit 4 is configuredto selectively drive the individual bypass units 30 ₁-30 _(n) to bypassthe corresponding power sources 10 ₁, 10 ₂, 10 ₃, 10 _(n), and tomeasure the output voltage V1 between the output terminals 11, 12 inorder to diagnose the power source arrangement 1. When at least one ofthe power sources 10 ₁-10 _(n) is bypassed, the output voltage V1corresponds to the sum of the output voltages of those power sourcesthat are not bypassed. The possibility to selectively bypass individualpower sources 10 ₁-10 _(n) offers the opportunity to diagnose the powersource arrangement 1 without directly measuring the voltages at theoutput terminals of the individual power sources 10 ₁-10 _(n), which inmany applications are not accessible anyway.

A first embodiment of a method of diagnosing the power sourcearrangement is now explained with reference to FIGS. 5A and 5B. Thesefigures schematically illustrate a power source arrangement 1 with aplurality of n=8 power sources 10 ₁-10 _(n) connected in series.However, employing n=8 power sources is only an example, any number ofpower sources other than 8 may be employed as well. In this embodiment,each power source 10 ₁-10 _(n) has a bypass unit 30 ₁-30 _(n) coupledthereto. Since in the following explanation only the operation state ofthe bypass units is relevant, which means whether the individual bypassunits 30 ₁-30 _(n) bypass the associated power source 10 ₁-10 _(n) or donot bypass the associated power source 10 ₁-10 _(n), the bypass units 30₁-30 _(n) are only schematically illustrated as switches that are eitherswitched on or switched off in FIGS. 6A and 6B. Referring to theexplanation above, the switches in the bypass units 30 ₁-30 _(n) arecontrolled by the measurement and control circuit 4 (not illustrated inFIGS. 5A and 5B).

In the diagnostic method at least two different groups of power sourcesare selected from the power source arrangement 1 and the voltage of eachgroup is measured between the output terminals 11, 12 by the measurementand control circuit 4 (not illustrated in FIGS. 5A and 5B). During themeasurement of the voltage of one group the power sources of the powersource arrangement 1 that do not belong the one group are bypassed. Inthe embodiment illustrated in FIGS. 5A and 5B two different groups ofpower sources are selected from the power source arrangement 1, namely afirst group including the power sources 10 ₂, 10 ₄, 10 ₆, 10 _(n), and asecond group including the power sources 10 ₁, 10 ₃, 10 ₅, 10 ₇.Referring to FIG. 5A, the voltage of the first group, which is the sumof the output voltages V10 ₂, V10 ₄, V10 ₆, V10 _(n) of the powersources of the first group is measured, while the power sources of thesecond group are bypassed. This voltage of the first group will bereferred to as first voltage in the following. Referring to FIG. 5B, thevoltage of the second group, which is the sum of the output voltages V10₁, V10 ₃, V10 ₅, V10 ₇, of the power sources of the second group, ismeasured while the power sources of the first group are bypassed. Thevoltage of the second group will be referred to as second voltage in thefollowing. The first and second voltages are compared in order to detectthe presence of an error or fault in the power source arrangement 1.

The individual bypass units 30 ₁-30 _(n) are driven by the measurementand control circuit 4 in order to bypass the power sources of the secondgroup when the first voltage is measured and in order to bypass thepower sources of the first group when the second voltage is measured.Further, the first and second voltages that are available between theoutput terminals 11, 12, of the power source arrangement 1 are measuredby the measurement and control circuit 4. However, for the ease ofillustration this measurement and control circuit 4 is not illustratedin FIGS. 5A and 5B.

For explanation purposes it is assumed that there is an error or faultin one of the power sources, such as, for example, in the power source10 ₆, so that an output voltage V10 ₆ of this power source 10 ₆ is lowerthan the output voltages of the other power sources. The power source 10₆ will be referred to as defect power source in the following. In thepresent embodiment, the defect power source 10 ₆ is part of the firstgroup, so that the first voltage is lower than the second voltage.According to one embodiment, the presence of an error in the powersource arrangement 1 is assumed when the magnitude of a differencebetween the first and second voltages is above a given threshold value.The “threshold value” can be an absolute value or can be a relativevalue that is dependent on one of the measured voltages. According toone embodiment, the threshold value is between 5% and 20% of one of thefirst and second voltages.

In the embodiment illustrated in FIGS. 5A and 5B two different groups ofpower sources are selected from the power source arrangement 1. However,this is only an example. According to a further embodiment, two or moregroups of power sources are selected from the power source arrangement 1and the voltage of each of these groups is measured, while the powersources of the other groups are bypassed. The voltage of each group isthen compared to the voltage of at least one other group, in order todetect, whether there is a group that has a lower voltage than the othergroups. The number of groups that are selected and of which the voltagesare measured, is arbitrary. However, the individual groups have the samenumber of power sources in this method. The groups are selected suchthat there is at least one power source in each group that is notincluded in the other group.

It is even possible to individually measure the voltage of each powersource 10 ₁-10 _(n). In this case, all the power sources except for thepower source that is to be measured are bypassed. According the oneembodiment, the voltage across each power source is measured. Thiscorresponds to selecting n groups of power sources with each of thesegroups including only one power source. According to one embodiment, thevoltage measured for one power source is compared to the voltage of atleast one neighboring power source, wherein an error of one power sourceis detected, when the voltage of this power source is significantlylower than the voltage of a neighboring power source. “Significantlylower” means the voltage of one power source is more than a giventhreshold value lower than the voltage of the neighboring power source.The “threshold value” can be an absolute value or can be a relativevalue that is dependent on one of the measured voltages. According toone embodiment, the threshold value is between 5% and 20% of one of themeasured voltages.

Although in the embodiment illustrated in FIGS. 5A and 5B the firstgroup includes those power sources 10 ₂, 10 ₄, 10 ₆, 10 _(n) of thepower source arrangement 1 having an even order number and the secondgroup includes those power sources 10 ₁, 10 ₃, 10 ₅, 10 ₇ with an oddorder number, this is only an example. The power sources that belong toone group can be selected arbitrarily. According to one embodiment, thetwo groups are disjunct, which means that there is no power source ofthe power source arrangement 1 that belongs to both of these groups ofpower sources.

In the embodiment explained above, the voltages of at least two groupsare compared that have the same number of power sources. However, thisis only an example. According to a further embodiment, voltages of atleast two groups are measured that have different numbers of powersources. In this method, in addition to measuring the voltages of thetwo groups a calculation step is performed that calculates for eachgroup a normalized voltage from the calculated voltage. The normalizedvoltage is dependent on the measured voltage and the number of powersources in each group. For explanation purposes it is assumed that thevoltage V1 _(p) of a first group of power sources with p power sourcesis measured and that the voltage V1 _(q) of a second group of powersources with q power sources is measured. p and q denote the numbers ofpower sources in the individual groups, with p and q being different.According to one embodiment, calculating the normalized voltagesincludes dividing the measured voltages V1 _(p), V1 _(q) by the numbersq and n, respectively, so that

V1_(p,n) =V1_(p) /p  (1a)

V1_(q,n) =V1_(q) /q  (1a),

where V1 _(p,n) denotes the first normalized voltage of the first groupand V1 _(q,n) denotes the second normalized voltage of the second group.

The normalized voltages are then compared in order to determine whetherone of the groups of power sources includes a power source that providesa lower output voltage than the other power sources in the first andsecond group. The presence of a power source providing a lower outputvoltage is assumed when the magnitude of the difference between thefirst and second normalized voltages is above a given threshold value.The “threshold value” can be an absolute value or can be a relativevalue that is dependent on one of the measured voltages. According toone embodiment, the threshold value is between 5% and 20% of one of thefirst and second voltages.

The first and second group of power sources may overlap, which meansthat there can be power sources that are included in both, the first andthe second group of power sources. However, since the numbers p and q ofpower sources in the two groups are different, there is always at leastone power source that is only included in one of the groups.

According to one embodiment, p=1 and q>1 so that the first groupincludes only one (p=1) power source, while the second group includesmore than one power source. However, this is only an example. Ingeneral, the number of power sources in each group is arbitrary.

Calculating normalized voltages from the measured voltages of theindividual groups allows the comparison of the measurement results ofgroups with different numbers of power sources. However, even in thosecases in which groups with the same number of power sources arecompared, normalized values of the measured voltages can be calculatedand the normalized values instead of the measured values can be comparedin order to detect whether one group of power sources includes a powersource providing a lower output voltage than the other power sources.

According to a further embodiment, not only the presence of an error isdetected, but the power source in which the error is present, isidentified. For this, a hierarchical diagnostic method is performed.This hierarchical method is based on a method as explained before, whichis a method in which one group of power sources is identified which isassumed to include a defect power source. One of the methods explainedbefore is then applied to this group in order to identify a sub-groupthat includes the defect power source, where the method is then appliedto the sub-group and so on, until a group including only one powersource is identified that includes the defect power source.

An embodiment of a hierarchical method explained with reference to FIGS.6A to 6D is based on the method explained with reference to FIGS. 5A and5B for identifying one of a plurality of groups that includes a defectpower source. However, each of the other methods explained before may beused as well.

For explanation purposes it is assumed that the first group as explainedwith reference to FIGS. 6A and 6B includes the defect power source 10 ₆.In order to identify which of the power sources of the second groupincludes the defect, at least two groups of power sources from thisfirst group are selected and the voltages of these groups are measuredand the measured voltages or the normalized voltages are compared.During measurement of the voltage of one group, the other power sources,which are the power sources not belonging to this group, are bypassed.Referring to FIGS. 6A and 6B the first group is subdivided into twosubgroups, namely a first subgroup which in the present embodimentincludes the power source 10 ₆ and 10 _(n) and a second subgroup whichincludes the power sources 10 ₂ and 10 ₄. Since the first subgroupincludes the defect power source 10 ₆, the voltage of the first subgroupis lower than the voltage of the second subgroup. Since the firstsubgroup still includes several power sources, namely two power sources10 ₆, 10 _(n) in the present embodiment, the subgroup is againsubdivided into further subgroups, which in the present embodiment eachonly include one power source, so that measuring the voltage of thesesubgroups corresponds to measuring the voltage of only one power source.These method steps are illustrated in FIGS. 6C and 6D, wherein in themethod step illustrated in FIG. 6C, the voltage of the defect powersource 10 ₆ is measured, while in the method step illustrated in FIG. 6Dthe voltage of the power source 10 _(n) is measured. By comparing thesevoltages power source 10 ₆ can be identified to be a defect powersource, because the voltage V10 ₆ of this power source is lower than thevoltage V10 _(n) of the other power source.

Subdividing each group which has been identified to include a defectpower source into only two subgroups is only an example. Each of thesegroups could also be subdivided in more than two subgroups in the wayexplained with reference to FIGS. 5A and 5B. Further, instead ofselecting the individual groups to be compared such that they includethe same number of power sources, these groups could also be selectedsuch that they include a different number of power sources. In thiscase, the normalized voltages instead of the measured voltages arecompared.

According to one embodiment, the measurement and control circuit 4includes an status output and the measurement and control circuit 4 isconfigured to provide a status signal ST (illustrated in dashed lines inFIGS. 1 and 2) that indicates whether there is an error in one of thepower sources 10 ₁-10 _(n) and/or which of the power sources includes anerror. According to one embodiment, the inverter 100 (see FIG. 1)receives the status signal ST and forwards the status signal or aninformation dependent on the status signal to a supervision entity, suchas an operator of a solar power plant in which the circuit arrangementis employed. In this case, the inverter 100 includes a communicationinterface through which the information can be forwarded via aconventional communication system, such as the internet or a telephonenetwork.

The voltage measured at the output terminals 11, 12 of the power sourcearrangement 1 can be an open circuit voltage, which is the voltage whenthere is no load connected to the output terminals 11, 12. According toa further embodiment, the voltage between the output terminals 11, 12 ismeasured when a load is connected to the output terminals 11, 12.According to one embodiment, the load can be implemented as an inverter100 as illustrated in FIG. 1. This inverter 100 may include a MaximumPower Point track (MPP). This MPP is configured to operate the powersource arrangement 1 in the Maximum Power Point, which is the operationpoint in which the power source arrangement 1 (in particular whenimplemented as a power source arrangement with PV modules as powersources) has the maximum efficiency. Since the MPP may vary when duringthe diagnostic process power sources are bypassed, the adjustment of theMPP may take some time, such as up to several seconds. According to oneembodiment, there is therefore a delay time between selecting a newgroup of power sources, which includes bypassing those power sources notbelonging to the group, and measuring the output voltage between theoutput terminals 11, 12.

According to one embodiment, the measurement and control circuit 4 isconfigured to regularly forward a status signal to the individual bypassunits 30 ₁-30 _(n), with this status signal simply indicating that themeasurement and control circuit 4 is active. According to oneembodiment, the bypass units are configured to bypass the associatedpower sources when no status signal has been received from themeasurement and control circuit 4 for a given time period, such as atime period in the range of several seconds. In this case, the completepower source arrangement 1 is bypassed, thereby reducing the DC voltagebetween its output terminals 11, 12 to zero.

Spatially relative terms such as “under”, “below”, “lower”, “over”,“upper” and the like, are used for ease of description to explain thepositioning of one element relative to a second element. These terms areintended to encompass different orientations of the device in additionto different orientations than those depicted in the figures. Further,terms such as “first”, “second”, and the like, are also used to describevarious elements, regions, sections, etc. and are also not intended tobe limiting. Like terms refer to like elements throughout thedescription.

As used herein, the terms “having”, “containing”, “including”,“comprising” and the like are open ended terms that indicate thepresence of stated elements or features, but do not preclude additionalelements or features. The articles “a”, “an” and “the” are intended toinclude the plural as well as the singular, unless the context clearlyindicates otherwise.

With the above range of variations and applications in mind, it shouldbe understood that the present invention is not limited by the foregoingdescription, nor is it limited by the accompanying drawings. Instead,the present invention is limited only by the following claims and theirlegal equivalents.

What is claimed is:
 1. A method of diagnosing a power source arrangementcomprising a plurality of n power sources connected in series betweenoutput terminals, wherein n≧2, the method comprising: selecting at leasttwo different groups of power sources from the power source arrangement;measuring a voltage of each of the at least two different groups betweenthe output terminals, wherein, during the measurement of the voltage ofone group, the power sources of the power source arrangement that do notbelong to the one group are bypassed; comparing the at least twomeasured voltages obtained through measuring the voltage of each of theat least two different groups or comparing at least two voltages thatare dependent on these at least two measured voltages.
 2. The method ofclaim 1, wherein the groups have a same number of power sources as andare disjunct from each other.
 3. The method of claim 2, wherein twogroups are selected, each comprising n/2 power sources.
 4. The method ofclaim 1, wherein the groups have different numbers of power sources fromeach other.
 5. The method of claim 4, further comprising: calculating anormalized voltage for each group, the normalized voltage of one groupbeing dependent on the measured voltage of the group and the number ofpower sources in the group; and comparing the normalized voltages. 6.The method of claim 5, wherein calculating one normalized voltagecomprises: dividing the measured voltage by a number of power sources ofthe group.
 7. The method of claim 1, further comprising: providing adiagnostic signal dependent on a result of the comparing.
 8. The methodof claim 7, further comprising: generating the diagnostic signal toassume an error level when a difference between two of the at least twomeasured voltages or between two of the at least two voltages dependenton the measured voltages is higher than a given threshold value.
 9. Themethod of claim 1, further comprising when a difference between two ofthe measured voltages or two of the voltages dependent on the measuredvoltages is higher than a threshold value: a) selecting at least twodifferent groups of power sources from a group that has a lowestvoltage; b) measuring the voltage of each group between the outputterminals, wherein during the measurement of the voltage of one groupthe power sources of the power source arrangement that do not belong tothe one group are bypassed; c) comparing the at least two voltages orvoltages dependent on the at least two voltages obtained throughmeasuring the voltage of each group.
 10. The method of claim 9, furthercomprising: repeating the method steps a) to b) until the group havingthe lowest voltage does only include one power source.
 11. The method ofclaim 1, wherein measuring the voltage of each group comprises measuringan open circuit voltage.
 12. The method of claim 1, wherein a MaximumPower Point Tracker (MPP) is connected to the output terminals, andwherein measuring the voltage of each group comprises measuring thevoltage with the MPP connected to the power source arrangement.
 13. Themethod of claim 1, wherein each power source comprises a photovoltaicmodule with a plurality of solar cells connected in series.
 14. Acircuit arrangement comprising: a power source arrangement comprisingoutput terminals and a plurality of n power sources connected in seriesbetween the output terminals, wherein n≧2; and a diagnostic circuitcoupled to the power source arrangement, the diagnostic circuitconfigured to select at least two different groups of power sources fromthe power source arrangement, the diagnostic circuit configured tomeasure a voltage of each of the at least two different groups betweenthe output terminals, wherein during the measurement of the voltage ofone group the power sources of the power source arrangement that do notbelong to the one group are bypassed, and the diagnostic circuitconfigured to compare the at least two measured voltages obtainedthrough measuring the voltage of each of the at least two groups or tocompare at least two voltages dependent on these at least two measuredvoltages.
 15. The circuit arrangement of claim 14, wherein thediagnostic circuit is configured to select individual groups having asame number of power sources and that are disjunct.
 16. The circuitarrangement of claim 15, wherein the diagnostic circuit is configured toselect two groups, each comprising n/2 power sources.
 17. The circuitarrangement of claim 14 wherein the diagnostic circuit is furtherconfigured to provide a diagnostic signal dependent on a result of thecomparison.
 18. The circuit arrangement of claim 17, wherein thediagnostic circuit is configured to generate the diagnostic signal toassume an error level when a difference between two of the at least twomeasured voltages or between two of the at least two voltages dependenton the measured voltages is higher than a given threshold value.
 19. Thecircuit arrangement of claim 14, wherein, when a difference between twoof the measured voltages or between two of the voltages dependent on themeasured voltages is higher than a threshold value, the diagnosticcircuit is a) configured to select at least two different groups ofpower sources from a group that has a lowest voltage; b) configured tomeasure the voltage of each group between the output terminals, whereinduring the measurement of the voltage of one group the power sources ofthe power source arrangement that do not belong to the one group arebypassed; c) configured to compare the at least two measured voltagesobtained through measuring the voltage of each group, or to compare twovoltages dependent on the at least two measured voltages.
 20. Thecircuit arrangement of claim 19 wherein the diagnostic circuit isfurther configured to repeat the method steps a) to b) until the grouphaving the lowest voltage does only include one power source.
 21. Thecircuit arrangement of claim 14, wherein the diagnostic circuit furthercomprises: a bypass circuit coupled to the power source arrangement; ameasurement and control circuit configured to measure a voltage betweenthe output terminals and configured to control the bypass circuit. 22.The circuit arrangement of claim 21, wherein the bypass circuit furthercomprises: at least one bypass unit coupled to one power source andconfigured to bypass the power source it is coupled to as controlled bythe measurement and control circuit.
 23. The circuit arrangement ofclaim 22, wherein each power source has a bypass unit coupled thereto.24. The circuit arrangement of claim 22, wherein the at least one bypassunit comprises: a switching element connected in parallel with theassociated power source; a control unit coupled to the measurement andcontrol circuit and configured to drive the switching element dependenton a control signal received from the measurement and control circuit.25. The circuit arrangement of claim 24, wherein the control unit isconfigured to switch the switching element on upon expiration of a givetime period in which no control signal has been received from themeasurement and control circuit.
 26. The circuit arrangement of claim14, wherein the diagnostic circuit is configured the measure an opencircuit voltage at the output terminals.
 27. The circuit arrangement ofclaim 14, further comprising: a Maximum Power Point Tracker (MPP)connected to the output terminals, wherein the diagnostic circuit isconfigured to measure a MPP voltage of each group.
 28. The circuitarrangement of claim 14, wherein each power source comprises aphotovoltaic module with a plurality of solar cells connected in series.